en
State University (France), Browse similar opportunities
SL-DRT-21-0830
Photonics, Imaging and displays
STMicroelectronics develops various CMOS-based technologies for imaging. The rise and democratization of image sensors is leading to a diversification of technological uses such as high-resolution imagery and telemetry for domestic and automotive use. One of the challenges is to meet market needs and adapt to the competition by constantly improving the performance and reliability of devices.The objective of this thesis is to study and model the reliability of avalanche photodetectors for single photon detection. The principle of this sensor lies in the ability to measure the transit time between an optical source and the detector, from a few centimeters to several tens of meters while being insensitive to the surrounding light. A matrix made up of thousands of pixels makes it possible to restore a faithful 3D image of the target. To date, first tests show that the detector degrades over time, leading to a loss of sensitivity and degradation of measurement precision. Quantifying these effects and understanding these drifts is absolutely necessary to improve the manufacturing process and develop a predictive model of reliability.The thesis will focus equally between the reliability of a single pixel and the reliability of a pixel matrix, in order to approach product reliability. The candidate will rely on a set of characterization and reliability measurement tools, as well as modeling and simulation tools developed at STMicroelectronics.
Département Composants Silicium (LETI)
Laboratoire de Caractérisation et Test Electrique
Grenoble
COIGNUS Jean
CEA
DRT/DCOS//LCTE
17 rue des Martyrs, 38054 GRENOBLE Cedex 9
Phone number: 0438783883
Email: jean.coignus@cea.fr
INSA Lyon
Electronique, Electrotechnique et Automatique (EEA)
Start date on 01-10-2020
CALMON Francis
INSA Lyon
Phone number:
Email: francis.calmon@insa-lyon.fr
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